bist

基本解释

Gary Bist is a Staff Technical Writer at IBM's Toronto Lab.
Gary Bist 是 IBM 多伦多实验室的专职技术作家。
Moreover, a scan test circuit was proposed. This circuit can implement scan test and high speed build in self test (BIST) for IP core chip tests.
另外，本文还针对IP核投片测试提出一种扫描测试电路结构，能够实现测试芯片的扫描测试和高速内建自测试（BIST）。
The impacts of these problems were analyzed, and the corresponding solutions were presented, at the same time, a test technology combining with BIST was introduced.
分析了这些问题的影响，提出了相应措施，并介绍了结合BIST技术进行逻辑簇测试的方法。